Computer Engineering · Fall 2026

SDSU COMPE 671 — VLSI Testing

Theory and techniques for testing VLSI circuits and systems. Analog/mixed-signal testing, Automatic Test Pattern Generation (ATPG), boundary scan and core-based testing, Built-in Self-Test (BIST), defect and fault diagnosis, Design For Testability (DFT), logic/fault simulation, memory test, machine learning applications in VLSI testing, scan design/architecture. Formerly numbered as E E 671.